THORNTON AND WALNUT GROVE GAS FIELDS, SACRAMENTO AND SAN JOAQUIN COUNTIES, CALIFORNIA.SILCOX J.1968; A.A.P.G. MEM.; USA; 1968, VOL. 1, NUM. 0009, P. 85 A 92Miscellaneous

REPORT OF A WORKSHOP ON ANALYTICAL ELECTRON MICROSCOPY HELD AT CORNELL UNIVERSITY, ITHACA, NEW YORK, USA, AUGUST 3-6, 1976.ISAACSON MS; SILCOX J.1976; ULTRAMICROSCOPY; NETHERL.; DA. 1976; VOL. 2; NO 1; PP. 89-104; BIBL. 18 REF.Article

DETECTION OF OPTICAL SURFACE GUIDED MODES IN THIN GRAPHITE FILMS BY HIGH-ENERGY ELECTRON SCATTERING.CHEN CH; SILCOX J.1975; PHYS. REV. LETTERS; U.S.A.; DA. 1975; VOL. 35; NO 6; PP. 390-393; BIBL. 12 REF.Article

DIRECT NONVERTICAL INTERBAND TRANSITIONS AT LARGE WAVE VECTORS IN ALUMINUM.CHEN CH; SILCOX J.1977; PHYS. REV., B; U.S.A.; DA. 1977; VOL. 16; NO 10; PP. 4246-4248; BIBL. 6 REF.Article

OXIDE STRUCTURE IN EVAPORATED ALUMINUM FILMS.PETTIT RB; SILCOX J.1974; J. APPL. PHYS.; U.S.A.; DA. 1974; VOL. 45; NO 7; PP. 2858-2866; BIBL. 22 REF.Article

ORIENTATION DEPENDENCE OF CORE EDGES IN ELECTRON-ENERGY-LOSS SPECTRA FROM ANISOTROPIC MATERIALSLEAPMAN RD; SILCOX J.1979; PHYS. REV. LETTERS; USA; DA. 1979; VOL. 42; NO 20; PP. 1361-1364; BIBL. 15 REF.Article

SURFACE GUIDED MODES IN AN ALUMINIUM OXIDE THIN FILM.CHEN CH; SILCOX J.1975; SOLID STATE COMMUNIC.; G.B.; DA. 1975; VOL. 17; NO 3; PP. 273-275; BIBL. 7 REF.Article

CRITICAL THICKNESSES IN SUPERCONDUCTING THIN FILMSDOLAN GJ; SILCOX J.1973; PHYS. REV. LETTERS; U.S.A.; DA. 1973; VOL. 30; NO 13; PP. 603-606; BIBL. 14 REF.Serial Issue

MEASUREMENT OF SURFACE-PLASMON DISPERSION IN OXIDIZED ALUMINUM FILMS.PETTIT RB; SILCOX J; VINCENT R et al.1975; PHYS. REV., B,; U.S.A.; DA. 1975; VOL. 11; NO 8; PP. 3116-3123; BIBL. 34 REF.Article

Experimental energy-loss function, Im[-1/∈(q,ω)], for aluminium = Fonction de perte d'énergie expérimentale, Im[-1/∈(q,ω)], pour l'aluminiumBATSON, P. E; SILCOX, J.Physical review. B, Condensed matter. 1983, Vol 27, Num 9, pp 5224-5239, issn 0163-1829Article

Observation of oxygen vacancy ordering and segregation in Perovskite oxidesKLIE, R. F; ITO, Y; STEMMER, S et al.Ultramicroscopy. 2001, Vol 86, Num 3-4, pp 289-302, issn 0304-3991Conference Paper

Nanometer width molybdenum selenide fibersHORNBOSTEL, M. D; HILLYARD, S; SILCOX, J et al.Nanotechnology (Bristol. Print). 1995, Vol 6, Num 3, pp 87-92, issn 0957-4484Article

Delocalization in inelastic scatteringMULLER, D. A; SILCOX, J.Ultramicroscopy. 1995, Vol 59, Num 1-4, pp 195-213, issn 0304-3991Conference Paper

Annular dark-field imaging : resolution and thickness effectsHILLYARD, S; LOANE, R. F; SILCOX, J et al.Ultramicroscopy. 1993, Vol 49, Num 1-4, pp 14-25, issn 0304-3991Article

Mapping sp² and sp³ states of carbon at sub-nanometre spatial resolutionMULLER, D. A; YUJIUN TZOU; RISHI RAJ et al.Nature (London). 1993, Vol 366, Num 6457, pp 725-727, issn 0028-0836Article

Ballistic electron studies and modification of the Au/Si interfaceFERNANDEZ, A; HALLEN, H. D; HUANG, T et al.Applied physics letters. 1990, Vol 57, Num 26, pp 2826-2828, issn 0003-6951, 3 p.Article

Clean grain boundaries and weak links in high T_c superconducting YBa₂Cu₃O_7-x thin filmsSHIN, D. H; SILCOX, J; RUSSEK, S. E et al.Applied physics letters. 1990, Vol 57, Num 5, pp 508-510, issn 0003-6951, 3 p.Article

Silicon-germanium interdiffusion and interfaces in self-assembled quantum dotsVANFLEET, R. R; BASILE, D. P; KAMINS, T. I et al.Applied physics. A, Materials science & processing (Print). 2007, Vol 86, Num 1, pp 1-9, issn 0947-8396, 9 p.Article

Radiolytic purification of CaO by electron beamsMKHOYAN, K. A; SILCOX, J; MCGUIRE, M. A et al.Philosophical magazine (2003. Print). 2006, Vol 86, Num 19, pp 2907-2917, issn 1478-6435, 11 p.Article

Subnanometer-diameter wires isolated in a polymer matrix by fast polymerizationGOLDEN, J. H; DISALVO, F. J; FRECHET, J. M. J et al.Science (Washington, D.C.). 1996, Vol 273, Num 5276, pp 782-784, issn 0036-8075Article

Scattering and spectral shape in ballistic-electron-emission microscopy of NiSi₂-Si(111) and Au-Si samplesHALLEN, H. D; FERNANDEZ, A; HUANG, T et al.Physical review. B, Condensed matter. 1992, Vol 46, Num 11, pp 7256-7259, issn 0163-1829Article

Resolution limits in annular dark field STEMSILCOX, J; XU, P; LOANE, R. F et al.Ultramicroscopy. 1992, Vol 47, Num 1-3, pp 173-186, issn 0304-3991Conference Paper

Elastic scanning in ballistic-electron-emission-microscopy studies of the epitaxial NiSi₂/Si(111) interfaceFERNANDEZ, A; HALLEN, H. D; HUANG, T et al.Physical review. B, Condensed matter. 1991, Vol 44, Num 7, pp 3428-3431, issn 0163-1829Article

Annular dark field electron microscope images with better than 2 Å resolution at 100 kVSHIN, D. H; KIRKLAND, E. J; SILCOX, J et al.Applied physics letters. 1989, Vol 55, Num 23, pp 2456-2458, issn 0003-6951Article

Schottky barrier diode on a submicron-thick silicon membrane using a dual surface fabrication techniqueLEE, K; SILCOX, J; LEE, C. A et al.Journal of applied physics. 1986, Vol 60, Num 11, pp 4038-4040, issn 0021-8979Article